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TS-101 Atmospheric Tritium Sampler
| MOQ: | 1 set |
| Price: | Negotiable |
| Standard Packaging: | Plywood box |
| Delivery Period: | 5~8 working days |
| Payment Method: | L/C,T/T |
| Supply Capacity: | 100 sets/month |
Detail Information
Place of Origin
China
Brand Name
SHUOBODA
Certification
ISO/CE
Model Number
TS-101
Sampling Flow:
0-5L/min, Adjustable Flow;
Semiconductor Cold Trap Working Temperature:
Commonly Used 0-30 ℃
Catalytic Bed Working Temperature:
400°C
Tritium Capture Efficiency:
≥ 95%
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Product Description
TS-101 Atmospheric Tritium Sampler
The TS-101 Atmospheric Total Tritium Sampler is a comprehensive system designed for precise collection of atmospheric tritium. This advanced instrument combines multiple components to ensure accurate sampling and monitoring of tritium levels in various environmental conditions.
System Components
• Air filter for particle removal
• Precision air pump
• Mass gas flow meter
• Methane generating reactor
• High temperature catalytic oxidation bed
• Semiconductor cold trap with self-circulating water cooling
• Automatic control system
Sampling Capabilities
The system offers comprehensive tritium collection with the ability to capture full tritium (HTO, HT and CH3T) or specifically target HTO. Operators can choose between manual and automatic operation modes to suit specific monitoring requirements.
Technical Specifications
| Sampling Flow Rate | 0-5 L/min, adjustable |
| Semiconductor Cold Trap Temperature | Commonly used range: 0-30°C |
| Catalytic Bed Temperature | 400°C operating temperature |
| Tritium Capture Efficiency | ≥ 95% |
| Sampling Time | User-defined settings |
Control & Monitoring Features
• Remote and local control functionality
• Touch screen interface for all operations and parameter settings
• Comprehensive alarm system with continuous notification to central control room
• Database management for operational history
• Real-time data query and reporting capabilities
The system provides complete database management functionality, enabling real-time queries of operational history data for individual devices within specified time periods. Custom reports can be generated based on various query conditions for comprehensive analysis and documentation.
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